Technologies Available for Licensing

The following technologies are available for immediate licensing:

Apparatus and Method for In-Situ Thickness and Stoichiometry Measurement of Thin Films
Detector for Gamma Rays
Nitrogen Detector and Method of Detecting
System and Method for the Production of Ultra-High Quantities of 18F-Fluoride
High Resolution 3-D Position Sensitive Detector for Gamma Rays

Click on the above links for more detailed information!